X-ray fluorescence spectrometer, the quality "new member" of Chipsmall

Issue Time：2022-12-14 14:06:27Author：ChipsmallSource：ChipsmallClick：357

On December 7, the quality department of Chipsmall welcomed a "new member" - X-ray fluorescence spectrometer(XRF), which is mainly used in the RoHS testing and analysis of electronic components, including Pb, Cd, Hg, Cr6+, PBBs, PBDEs, etc., to ensure that the electronic components distributed comply with the RoHS Directive.

This X-ray fluorescence spectrometer is a physical elemental analysis method with special advantages such as rapid, non-destructive sample, simultaneous analysis of multiple elements, and low analysis cost. Its analysis accuracy is comparable to wet chemistry, and it takes only about three minutes to analyze multiple elements of electronic components at the same time, and there is no physical and chemical damage to the electronic components being tested and analyzed, and an accurate test report can be automatically generated on the computer after the test is completed.

It uses a small X-ray tube, and the generated X-ray is directly irradiated to the sample to produce secondary X-ray fluorescence. The optical signal is directly entered into the detector, and then processed by the analyzer for different energy signals. Finally, the data is processed on the computer, and the energy resolution ( qualitative analysis ) and quantitative determination of the X-ray spectrum with a wide energy range can be.